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@inproceedings{TUW-103696,
    author = {Palankovski, Vassil and Selberherr, Siegfried and Quay, R{\"u}diger and Schultheis, R.},
    title = {{A}nalysis of {H}{B}{T} {B}ehavior {A}fter {S}trong {E}lectrothermal {S}tress},
    booktitle = {{P}roceedings of the {I}nternational {C}onference on {S}imulation of {S}emiconductor {P}rocesses and {D}evices ({S}{I}{S}{P}{A}{D})},
    year = {2000},
    pages = {245--248},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2001/CP2000_Palankovski_2.pdf},
    isbn = {0-7803-6279-9},
    doi = {10.1109/SISPAD.2000.871254},
    note = {poster presentation: {I}nternational {C}onference on {S}imulation of {S}emiconductor {P}rocesses and {D}evices ({S}{I}{S}{P}{A}{D}), {S}eattle, {W}{A}, {U}{S}{A}; 2000-09-06 -- 2000-09-08}
}