@inproceedings{TUW-103696, author = {Palankovski, Vassil and Selberherr, Siegfried and Quay, R{\"u}diger and Schultheis, R.}, title = {{A}nalysis of {H}{B}{T} {B}ehavior {A}fter {S}trong {E}lectrothermal {S}tress}, booktitle = {{P}roceedings of the {I}nternational {C}onference on {S}imulation of {S}emiconductor {P}rocesses and {D}evices ({S}{I}{S}{P}{A}{D})}, year = {2000}, pages = {245--248}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2001/CP2000_Palankovski_2.pdf}, isbn = {0-7803-6279-9}, doi = {10.1109/SISPAD.2000.871254}, note = {poster presentation: {I}nternational {C}onference on {S}imulation of {S}emiconductor {P}rocesses and {D}evices ({S}{I}{S}{P}{A}{D}), {S}eattle, {W}{A}, {U}{S}{A}; 2000-09-06 -- 2000-09-08} }