@inproceedings{TUW-105833, author = {Ceric, Hajdin and Selberherr, Siegfried}, title = {{E}lectromigration {I}nduced {E}volution of {V}oids in {C}urrent {C}rowding {A}reas of {I}nterconnects}, booktitle = {{P}roceedings of the 13th {E}uropean {S}ymposium on {R}eliability of {E}lectron {D}evices, {F}ailure {P}hysics and {A}nalysis}, year = {2002}, pages = {140--144}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2003/CP2002_Ceric_1.pdf}, isbn = {0-7803-7416-9}, note = {talk: {I}{E}{E}{E} {I}nternational {S}ymposium on the {P}hysical and {F}ailure {A}nalysis of {I}ntegrated {C}ircuits ({I}{P}{F}{A}), {S}ingapore; 2002-07-08 -- 2002-07-12} }