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@article{TUW-105834,
    author = {Ceric, Hajdin and Selberherr, Siegfried},
    title = {{S}imulative {P}rediction of the {R}esistance {C}hange due to {E}lectromigration {I}nduced {V}oid {E}volution},
    journal = {{M}icroelectronics {R}eliability},
    year = {2002},
    volume = {42},
    number = {9-11},
    pages = {1457--1460},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2003/CP2002_Ceric_3.pdf},
    doi = {10.1016/S0026-2714(02)00169-5}
}