@article{TUW-105834, author = {Ceric, Hajdin and Selberherr, Siegfried}, title = {{S}imulative {P}rediction of the {R}esistance {C}hange due to {E}lectromigration {I}nduced {V}oid {E}volution}, journal = {{M}icroelectronics {R}eliability}, year = {2002}, volume = {42}, number = {9-11}, pages = {1457--1460}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2003/CP2002_Ceric_3.pdf}, doi = {10.1016/S0026-2714(02)00169-5} }