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@unpublished{TUW-105835,
    author = {Ceric, Hajdin and Selberherr, Siegfried},
    title = {{S}imulative {P}rediction of the {R}esistance {C}hange due to {E}lectromigration {I}nduced {V}oid {E}volution},
    year = {2002},
    note = {poster presentation: {E}uropean {S}ymposium on {R}eliability of {E}lectron {D}evices, {F}ailure {P}hysics and {A}nalysis  ({E}{S}{R}{E}{F}), {R}imini; 2002-10-07 -- 2002-10-11}
}