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@inproceedings{TUW-178233,
    author = {Orio, Roberto and Ceric, Hajdin and Cervenka, Johann and Selberherr, Siegfried},
    title = {{T}he {E}ffect of {M}icrostructure on {E}lectromigration-{I}nduced {F}ailure {D}evelopment},
    booktitle = {{E}{C}{S} {T}ransactions},
    year = {2009},
    pages = {345--352},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2009/CP2009_Orio_5.pdf},
    isbn = {978-1-56677-737-7},
    note = {talk: {I}ntl. {S}ymposium on {M}icroelectronics {T}echnology and {D}evices ({S}{B}{M}icro), {N}atal; 2009-08-31 -- 2009-09-03}
}