@inproceedings{TUW-178233, author = {Orio, Roberto and Ceric, Hajdin and Cervenka, Johann and Selberherr, Siegfried}, title = {{T}he {E}ffect of {M}icrostructure on {E}lectromigration-{I}nduced {F}ailure {D}evelopment}, booktitle = {{E}{C}{S} {T}ransactions}, year = {2009}, pages = {345--352}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2009/CP2009_Orio_5.pdf}, isbn = {978-1-56677-737-7}, note = {talk: {I}ntl. {S}ymposium on {M}icroelectronics {T}echnology and {D}evices ({S}{B}{M}icro), {N}atal; 2009-08-31 -- 2009-09-03} }