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@unpublished{TUW-186810,
    author = {Franco, J. and Kaczer, Ben and Stesmans, A. and Afanas'Ev, V. and Martens, K. and Aoulaiche, M. and Grasser, Tibor and Mitard, J. and Groeseneken, G.},
    title = {{I}mpact of {S}i-{P}assivation {T}hickness and {P}rocessing on {N}{B}{T}{I} {R}eliability of {G}e and {S}i{G}e p{M}{O}{S}{F}{E}{T}s},
    year = {2009},
    note = {talk: 40\textsuperscript{th} {S}emiconductor {I}nterface {S}pecialists {C}onference ({S}{I}{S}{C}), {W}ashington; 2009-12-03 -- 2009-12-05}
}