@article{TUW-199029, author = {Franco, J. and Kaczer, Ben and Toledano-Luque, M. and Roussel, Ph. J. and Hehenberger, Philipp Paul and Grasser, Tibor and Mitard, J. and Eneman, G. and Hoffmann, T.Y. and Groeseneken, G.}, title = {{On the Impact of the Si Passivation Layer Thickness on the NBTI of Nanoscaled Si{$_{0.45}$}Ge{$_{0.55}$} pMOSFETs}}, journal = {{M}icroelectronic {E}ngineering}, year = {2011}, volume = {88}, number = {7}, pages = {1388--1391}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2011/JB2011_Hehenberger_1.pdf}, doi = {10.1016/j.mee.2011.03.065} }