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@inproceedings{TUW-208559,
    author = {Ceric, Hajdin and Orio, Roberto and Zisser, Wolfhard and Schnitzer, V. and Selberherr, Siegfried},
    title = {{M}odeling of {M}icrostructural {E}ffects on {E}lectromigration {F}ailure},
    booktitle = {{A}bstracts of 12th {I}nternational {W}orkshop on {S}tress-{I}nduced {P}henomena in {M}icroelectronics},
    year = {2012},
    pages = {50--51},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2011/CP2012_Ceric_1.pdf},
    note = {invited; talk: {I}nternational {W}orkshop on {S}tress-{I}nduced {P}henomena in {M}icroelectronics, {K}yoto, {J}apan; 2012-05-28 -- 2012-05-30}
}