@inproceedings{TUW-208559, author = {Ceric, Hajdin and Orio, Roberto and Zisser, Wolfhard and Schnitzer, V. and Selberherr, Siegfried}, title = {{M}odeling of {M}icrostructural {E}ffects on {E}lectromigration {F}ailure}, booktitle = {{A}bstracts of 12th {I}nternational {W}orkshop on {S}tress-{I}nduced {P}henomena in {M}icroelectronics}, year = {2012}, pages = {50--51}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2011/CP2012_Ceric_1.pdf}, note = {invited; talk: {I}nternational {W}orkshop on {S}tress-{I}nduced {P}henomena in {M}icroelectronics, {K}yoto, {J}apan; 2012-05-28 -- 2012-05-30} }