@article{TUW-208625, author = {Franco, J. and Kaczer, Ben and Toledano-Luque, M. and Bukhori, Muhammad Faiz and Roussel, Ph. J. and Grasser, Tibor and Asenov, A and Groeseneken, G.}, title = {{Impact of Individual Charged Gate-Oxide Defects on the Entire I{$_{D}$} -V{$_{G}$} Characteristic of Nanoscaled FETs}}, journal = {{I}{E}{E}{E} {E}lectron {D}evice {L}etters}, year = {2012}, volume = {33}, number = {6}, pages = {779--781}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2011/JB2012_Grasser_1.pdf} }