@article{TUW-208758, author = {Ceric, Hajdin and Orio, Roberto and Selberherr, Siegfried}, title = {{I}nterconnect {R}eliability {D}ependence on {F}ast {D}iffusivity {P}aths}, journal = {{M}icroelectronics {R}eliability}, year = {2012}, volume = {52}, number = {8}, pages = {1532--1538}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2012_Ceric_1.pdf}, doi = {10.1016/j.microrel.2011.09.035}, note = {invited} }