[Back]

@article{TUW-208758,
    author = {Ceric, Hajdin and Orio, Roberto and Selberherr, Siegfried},
    title = {{I}nterconnect {R}eliability {D}ependence on {F}ast {D}iffusivity {P}aths},
    journal = {{M}icroelectronics {R}eliability},
    year = {2012},
    volume = {52},
    number = {8},
    pages = {1532--1538},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2012_Ceric_1.pdf},
    doi = {10.1016/j.microrel.2011.09.035},
    note = {invited}
}