@inproceedings{TUW-209876, author = {Orio, Roberto and Ceric, Hajdin and Selberherr, Siegfried}, title = {{A}nalysis of {R}esistance {C}hange {D}evelopment due to {V}oiding in {C}opper {I}nterconnects ended by a {T}hrough {S}ilicon {V}ia}, booktitle = {{E}{C}{S} {T}ransactions}, year = {2012}, pages = {273--280}, publisher = {49}, address = {1}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2012/CP2012_Orio_2.pdf}, isbn = {978-1-56677-990-6}, doi = {10.1149/04901.0273ecst}, note = {talk: {I}nternational {S}ymposium on {M}icroelectronics {T}echnology and {D}evices ({S}{B}{M}icro), {B}rasilia, {B}razil; 2012-08-30 -- 2012-09-02} }