@article{TUW-210447, author = {Orio, Roberto and Ceric, Hajdin and Selberherr, Siegfried}, title = {{E}lectromigration {F}ailure in a {C}opper {D}ual-{D}amascene {S}tructure with a {T}hrough {S}ilicon {V}ia}, journal = {{M}icroelectronics {R}eliability}, year = {2012}, volume = {52}, pages = {1981--1986}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2012_Orio_1.pdf}, doi = {10.1016/j.microrel.2012.07.021} }