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@article{TUW-210447,
    author = {Orio, Roberto and Ceric, Hajdin and Selberherr, Siegfried},
    title = {{E}lectromigration {F}ailure in a {C}opper {D}ual-{D}amascene {S}tructure with a {T}hrough {S}ilicon {V}ia},
    journal = {{M}icroelectronics {R}eliability},
    year = {2012},
    volume = {52},
    pages = {1981--1986},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2012_Orio_1.pdf},
    doi = {10.1016/j.microrel.2012.07.021}
}