@inproceedings{TUW-231524, author = {Zisser, Wolfhard and Ceric, Hajdin and Weinbub, Josef and Selberherr, Siegfried}, title = {{E}lectromigration {R}eliability of {O}pen {T}{S}{V} {S}tructures}, booktitle = {{A}bstracts 25th {E}uropean {S}ymposium on {R}eliability of {E}lectron {D}evices, {F}ailure {P}hysics and {A}nalysis ({E}{S}{R}{E}{F})}, year = {2014}, pages = {48}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2014_Zisser_2.pdf}, note = {poster presentation: {E}uropean {S}ymposium on {R}eliability of {E}lectron {D}evices, {F}ailure {P}hysics and {A}nalysis ({E}{S}{R}{E}{F}), {B}erlin, {G}ermany; 2014-09-29 -- 2014-10-02} }