@article{TUW-231579, author = {Zisser, Wolfhard and Ceric, Hajdin and Weinbub, Josef and Selberherr, Siegfried}, title = {{E}lectromigration {R}eliability of {O}pen {T}{S}{V} {S}tructures}, journal = {{M}icroelectronics {R}eliability}, year = {2014}, volume = {54}, number = {9-10}, pages = {2133--2137}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2014_Zisser_1.pdf}, doi = {10.1016/j.microrel.2014.07.099} }