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@article{TUW-231579,
    author = {Zisser, Wolfhard and Ceric, Hajdin and Weinbub, Josef and Selberherr, Siegfried},
    title = {{E}lectromigration {R}eliability of {O}pen {T}{S}{V} {S}tructures},
    journal = {{M}icroelectronics {R}eliability},
    year = {2014},
    volume = {54},
    number = {9-10},
    pages = {2133--2137},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2014_Zisser_1.pdf},
    doi = {10.1016/j.microrel.2014.07.099}
}