@inproceedings{TUW-249785, author = {Rovitto, Marco and Ceric, Hajdin}, title = {{E}lectromigration {I}nduced {V}oiding and {R}esistance {C}hange in {T}hree-{D}imensional {C}opper {T}hrough {S}ilicon {V}ias}, booktitle = {{P}roceedings of {I}{E}{E}{E} {E}lectronic {C}omponents and {T}echnology {C}onference ({E}{C}{T}{C})}, year = {2016}, pages = {550--556}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2016/CP2016_Rovitto1.pdf}, isbn = {978-1-5090-1204-6}, doi = {10.1109/ECTC.2016.49}, note = {talk: {I}{E}{E}{E} {E}lectronic {C}omponents and {T}echnology {C}onference ({E}{C}{T}{C}), {L}as {V}egas, {N}{V}, {U}{S}{A}; 2016-05-31 -- 2016-06-03} }