@article{TUW-250256, author = {Illarionov, Yury and Rzepa, Gerhard and Waltl, Michael and Knobloch, Theresia and Grill, Alexander and Furchi, Marco Mercurio and M{\"u}ller, Thomas and Grasser, Tibor}, title = {{The Role of Charge Trapping in MoS{$_{2}$}/SiO{$_{2}$} and MoS{$_{2}$}/hBN Field-Effect Transistors}}, journal = {2{D} {M}aterials}, year = {2016}, volume = {3}, number = {3}, pages = {035004-1--035004-10}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2016/JB2016_Illarionov_2.pdf}, doi = {10.1088/2053-1583/3/3/035004} }