@inproceedings{TUW-260317, author = {Illarionov, Yury and Waltl, Michael and Jech, Markus and Kim, J.-S. and Akinwande, D. and Grasser, Tibor}, title = {{R}eliability of {B}lack {P}hosphorus {F}ield-{E}ffect {T}ransistors with {R}espect to {B}ias-{T}emperature and {H}ot-{C}arrier {S}tress}, booktitle = {{P}roceedings of the {I}nternational {R}eliability {P}hysics {S}ymposium ({I}{R}{P}{S})}, year = {2017}, pages = {6A-6.1--6A-6.6}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2017/CP2017_Illarionov_2.pdf}, isbn = {978-1-5090-6642-1}, doi = {10.1109/IRPS.2017.7936338}, note = {talk: {I}nternational {R}eliability {P}hysics {S}ymposium ({I}{R}{P}{S}), {M}onterey, {C}{A}, {U}{S}{A}; 2017-04-02 -- 2017-04-06} }