@article{TUW-263763, author = {Illarionov, Yury and Smithe, Kirby K.H. and Waltl, Michael and Knobloch, Theresia and Pop, Eric and Grasser, Tibor}, title = {{Improved Hysteresis and Reliability of MoS{$_{2}$} Transistors With High-Quality CVD Growth and Al{$_{2}$}O{$_{3}$} Encapsulation}}, journal = {{I}{E}{E}{E} {E}lectron {D}evice {L}etters}, year = {2017}, volume = {38}, number = {12}, pages = {1763--1766}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2017/JB2017_Illarionov_4.pdf}, doi = {10.1109/LED.2017.2768602} }