@article{TUW-268740, author = {Kaczer, Ben and Franco, J. and Weckx, P. and Roussel, Ph. J. and Putcha, Vamsi and Bury, E. and Simicic, Marko and Chasin, A and Linten, D and Parvais, Bertrand and Catthoor, F. and Rzepa, Gerhard and Waltl, Michael and Grasser, Tibor}, title = {{A} {B}rief {O}verview of {G}ate {O}xide {D}efect {P}roperties and {T}heir {R}elation to {M}{O}{S}{F}{E}{T} {I}nstabilities and {D}evice and {C}ircuit {T}ime-{D}ependent {V}ariability}, journal = {{M}icroelectronics {R}eliability}, year = {2018}, volume = {81}, pages = {186--194}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Rzepa_1.pdf}, doi = {10.1016/j.microrel.2017.11.022}, note = {invited} }