@article{TUW-277392, author = {G{\"o}s, Wolfgang and Wimmer, Yannick and El-Sayed, Al-Moatasem and Rzepa, Gerhard and Jech, Markus and Shluger, A. L. and Grasser, Tibor}, title = {{I}dentification of {O}xide {D}efects in {S}emiconductor {D}evices: {A} {S}ystematic {A}pproach {L}inking {D}{F}{T} to {R}ate {E}quations and {E}xperimental {E}vidence}, journal = {{M}icroelectronics {R}eliability}, year = {2018}, volume = {87}, pages = {286--320}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Goes_1.pdf}, doi = {10.1016/j.microrel.2017.12.021} }