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@inproceedings{TUW-282795,
    author = {Ceric, Hajdin and Selberherr, Siegfried and Zahedmanesh, Houman and Orio, Roberto and Croes, Kristof},
    title = {{A}ssessment of {E}lectromigration in {N}ano{\&}{\#}8208;{I}nterconnects},
    booktitle = {{A}bstracts of the {I}nternational {C}onference on {R}eliability and {S}tress-{R}elated {P}henomena in {N}anoelectronics ({I}{R}{S}{P})},
    year = {2019},
    pages = {7},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Ceric_1.pdf},
    note = {invited; talk: {I}nternational {C}onference on {R}eliability and {S}tress-{R}elated {P}henomena in {N}anoelectronics ({I}{R}{S}{P}), {S}an {J}ose, {U}{S}{A}; 2019-11-04 -- 2019-11-06}
}