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@article{TUW-287013,
    author = {Berens, Judith and Pobegen, Gregor and Eichinger, Thomas and Rescher, Gerald and Grasser, Tibor},
    title = {{Cryogenic Characterization of NH{$_{3}$} Post Oxidation Annealed 4H-SiC Trench MOSFETs}},
    journal = {{M}aterials {S}cience {F}orum},
    year = {2019},
    volume = {963},
    pages = {175--179},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2019/JB2020_Berens_1.pdf},
    doi = {10.4028/www.scientific.net/MSF.963.175}
}