@article{TUW-287013, author = {Berens, Judith and Pobegen, Gregor and Eichinger, Thomas and Rescher, Gerald and Grasser, Tibor}, title = {{Cryogenic Characterization of NH{$_{3}$} Post Oxidation Annealed 4H-SiC Trench MOSFETs}}, journal = {{M}aterials {S}cience {F}orum}, year = {2019}, volume = {963}, pages = {175--179}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2019/JB2020_Berens_1.pdf}, doi = {10.4028/www.scientific.net/MSF.963.175} }