@article{TUW-288537, author = {Shah, Ambika and Rossi, Daniele and Sharma, Vishal and Vishvakarma, Santosh Kumar and Waltl, Michael}, title = {{S}oft {E}rror {H}ardening {E}nhancement {A}nalysis of {N}{B}{T}{I} {T}olerant {S}chmitt {T}rigger {C}ircuit}, journal = {{M}icroelectronics {R}eliability}, year = {2020}, volume = {107}, pages = {113617}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2020/JB2020_Shah_4.pdf}, doi = {10.1016/j.microrel.2020.113617} }