@incollection{TUW-289358, author = {Stampfer, Bernhard and Grill, Alexander and Waltl, Michael}, title = {{A}dvanced {E}lectrical {C}haracterization of {S}ingle {O}xide {D}efects {U}tilizing {N}oise {S}ignals}, booktitle = {{N}oise in {N}anoscale {S}emiconductor {D}evices}, year = {2020}, editor = {Grasser, Tibor}, pages = {229--257}, publisher = {{S}pringer {I}nternational {P}ublishing}, url = {https://www.iue.tuwien.ac.at/pdf/ib_2020/BC2020_Stampfer_1.pdf}, isbn = {978-3-030-37499-0}, doi = {10.1007/978-3-030-37500-3{\_}7} }