@inproceedings{TUW-289443, author = {Illarionov, Yury and Grasser, Tibor}, title = {{R}eliability of 2{D} {F}ield-{E}ffect {T}ransistors: from {F}irst {P}rototypes to {S}calable {D}evices}, booktitle = {{P}roceedings of the {I}nternational {S}ymposium on {P}hysical and {F}ailure {A}nalysis of {I}ntegrated {C}ircuits ({I}{P}{F}{A})}, year = {2019}, pages = {1--6}, url = {http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Illarionov_4.pdf}, doi = {10.1109/IPFA47161.2019.8984799}, note = {invited; talk: {I}{E}{E}{E} {I}nternational {S}ymposium on the {P}hysical and {F}ailure {A}nalysis of {I}ntegrated {C}ircuits ({I}{P}{F}{A}), {H}angzhou, {C}hina; 2019-07-02 -- 2019-07-05} }