@article{TUW-290683, author = {Waltl, Michael}, title = {{R}eliability of {M}iniaturized {T}ransistors from the {P}erspective of {S}ingle-{D}efects}, journal = {{M}icromachines}, year = {2020}, volume = {11}, number = {8}, pages = {736-1--736-21}, url = {https://www.iue.tuwien.ac.at/pdf/ib_2020/JB2020_Waltl_2.pdf}, doi = {10.3390/mi11080736}, note = {invited} }