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@article{TUW-290683,
    author = {Waltl, Michael},
    title = {{R}eliability of {M}iniaturized {T}ransistors from the {P}erspective of {S}ingle-{D}efects},
    journal = {{M}icromachines},
    year = {2020},
    volume = {11},
    number = {8},
    pages = {736-1--736-21},
    url = {https://www.iue.tuwien.ac.at/pdf/ib_2020/JB2020_Waltl_2.pdf},
    doi = {10.3390/mi11080736},
    note = {invited}
}