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@inproceedings{TUW-293391,
    author = {Knobloch, Theresia and Michl, Jakob and Waldh{\"o}r, Dominic and Illarionov, Yury and Stampfer, Bernhard and Grill, Alexander and Zhou, R. and Wu, P. and Waltl, Michael and Appenzeller, J and Grasser, Tibor},
    title = {{Analysis of Single Electron Traps in Nano-scaled MoS{$_{2}$} FETs at Cryogenic Temperatures}},
    booktitle = {{P}roceedings of the {D}evice {R}esearch {C}onference ({D}{R}{C})},
    year = {2020},
    pages = {52--53},
    url = {http://www.iue.tuwien.ac.at/pdf/ib_2020/CP2020_Knobloch_1.pdf},
    note = {talk: {D}evice {R}esearch {C}onference ({D}{R}{C}), {C}olumbus, {O}{H}, {U}{S}{A} - virtual; 2020-06-21 -- 2020-06-24}
}