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@book{TUW-304558,
    editor = {Filipovic, Lado and Grasser, Tibor},
    title = {{M}iniaturized {T}ransistors, {V}olume {I}{I}},
    publisher = {{M}{D}{P}{I}},
    year = {2022},
    address = {{B}asel},
    numpages = {352},
    isbn = {978-3-0365-4169-3},
    doi = {10.3390/books978-3-0365-4170-9},
    keywords = {{C}{M}{O}{S}, transistor scaling, nanoscale devices, quantum transport, metalization, back-end-of-line reliability, process reliability, semiconductor device modeling, compact modeling, {F}in{F}{E}{T}, semiconductors, integrated circuits}
}