@book{TUW-304558, editor = {Filipovic, Lado and Grasser, Tibor}, title = {{M}iniaturized {T}ransistors, {V}olume {I}{I}}, publisher = {{M}{D}{P}{I}}, year = {2022}, address = {{B}asel}, numpages = {352}, isbn = {978-3-0365-4169-3}, doi = {10.3390/books978-3-0365-4170-9}, keywords = {{C}{M}{O}{S}, transistor scaling, nanoscale devices, quantum transport, metalization, back-end-of-line reliability, process reliability, semiconductor device modeling, compact modeling, {F}in{F}{E}{T}, semiconductors, integrated circuits} }