H. Ceric, S. Selberherr:
"Simulative Prediction of the Resistance Change due to Electromigration Induced Void Evolution";
Microelectronics Reliability, 42 (2002), 9-11; S. 1457 - 1460.
http://dx.doi.org/10.1016/S0026-2714(02)00169-5Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2003/CP2002_Ceric_3.pdf