W. Gös, M. Karner, V. Sverdlov, T. Grasser:
"Charging and Discharging of Oxide Defects in Reliability Issues";
IEEE Transactions on Device and Materials Reliability, 8 (2008), 3; S. 491 - 500.
http://dx.doi.org/10.1109/TDMR.2008.2005247Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2008/JB2008_Goess_1.pdf