T. Grasser, B. Kaczer:
"Evidence That Two Tightly Coupled Mechanisms Are Responsible for Negative Bias Temperature Instability in Oxynitride MOSFETs";
IEEE Transactions on Electron Devices, 56 (2009), 5; S. 1056 - 1062.
http://dx.doi.org/10.1109/TED.2009.2015160Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2009/JB2009_Grasser_2.pdf