V. Sverdlov, T. Windbacher, F. Schanovsky, S. Selberherr:
"Mobility Modeling in Advanced MOSFETs with Ultra-Thin Silicon Body under Stress";
Journal Integrated Circuits and Systems, 4 (2009), 2; S. 55 - 60.
http://dx.doi.org/10.29292/jics.v4i2.298Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2009/JB2009_Sverdlov_1.pdf