[Zurück]

R. Orio, H. Ceric, S. Selberherr:
"Analysis of Electromigration in Dual-Damascene Interconnect Structures";
Journal Integrated Circuits and Systems, 4 (2009), 2; S. 67 - 72.

http://dx.doi.org/10.29292/jics.v4i2.300

http://www.iue.tuwien.ac.at/pdf/ib_2009/JB2009_Orio_1.pdf