W. Gös, F. Schanovsky, H. Reisinger, B. Kaczer, T. Grasser:
"Bistable Defects as the Cause for NBTI and RTN";
Solid State Phenomena (eingeladen), 178-179 (2011), S. 473 - 482.
http://dx.doi.org/10.4028/www.scientific.net/SSP.178-179.473Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2011/JB2011_Goes_1.pdf