K. Rott, H. Reisinger, S. Aresu, C. Schlünder, K. Kölpin, W. Gustin, T. Grasser:
"New Insights on the PBTI Phenomena in SiON pMOSFETs";
Microelectronics Reliability, 52 (2012), 9-10; S. 1891 - 1894.
http://dx.doi.org/10.1016/j.microrel.2012.06.015Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2012_Grasser_2.pdf