B. Kaczer, M. Toledano-Luque, W. Gös, T. Grasser, G. Groeseneken:
"Gate Current Random Telegraph Noise and Single Defect Conduction";
Microelectronic Engineering, 109 (2013), S. 123 - 125.
http://dx.doi.org/10.1016/j.mee.2013.03.110Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2013_Goes_1.pdf