W. Gös, F. Schanovsky, T. Grasser:
"Advanced Modeling of Oxide Defects";
in: "Bias Temperature Instability for Devices and Circuits", T. Grasser (Hrg.); Springer New York, 2013, ISBN: 978-1-4614-7909-3, S. 409 - 446.
http://dx.doi.org/10.1007/978-1-4614-7909-3_16Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2014/BC2014_Goes_1.pdf