S. E. Tyaginov, M. Bina, J. Franco, Y. Wimmer, B. Kaczer, T. Grasser:
"On the Importance of Electron-Electron Scattering for Hot-Carrier Degradation";
Japanese Journal of Applied Physics, 54 (2015), S. 1 - 6.
http://dx.doi.org/10.7567/JJAP.54.04DC18Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2015_Tyaginov_1.pdf