L. Filipovic, S. Selberherr:
"Stress Considerations for System-on-Chip Gas Sensor Integration in CMOS Technology";
IEEE Transactions on Device and Materials Reliability, 16 (2016), 4; S. 483 - 495.
http://dx.doi.org/10.1109/TDMR.2016.2625461Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2016/JB2016_Filipovic_2.pdf