J. Stathis, S. Mahapatra, T. Grasser:
"Controversial Issues in Negative Bias Temperature Instability";
Microelectronics Reliability, 81 (2018), S. 244 - 251.
http://dx.doi.org/10.1016/j.microrel.2017.12.035Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Grasser_1.pdf