A.-M. El-Sayed, M. Watkins, T. Grasser, A. Shluger:
"Effect of Electric Field on Migration of Defects in Oxides: Vacancies and Interstitials in Bulk MgO";
Physical Review B, 98 (2018), 6; S. 064102.
http://dx.doi.org/10.1103/PhysRevB.98.064102Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_El-Sayed-1.pdf