H. Ceric, H. Zahedmanesh, K. Croes:
"Analysis of Electromigration Failure of Nano-Interconnects through a Combination of Modeling and Experimental Methods";
Microelectronics Reliability, 100-101 (2019), S. 113362.
http://dx.doi.org/10.1016/j.microrel.2019.06.054Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2019/JB2019_Ceric_1.pdf