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@techreport{TUW-213990,
    author = {Hofbauer, Michael and Schweiger, Kurt and Dietrich, Horst and Zimmermann, Horst and Schmid, Ulrich and Giesen, U.},
    title = {Messung der Auswirkungen von ionisierender Strahlung auf 90 nm CMOS Schaltungen},
    institution = {E354 - Institute of Electrodynamics, Microwave and Circuit Engineering, E191 - Institute of Computer Engineering; Vienna University of Technology},
    year = {2012}
}


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