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@article{TUW-224926,
    author = {Hofbauer, Michael and Schweiger, Kurt and Zimmermann, Horst and Giesen, Ulrich and Langner, Frank and Schmid, Ulrich and Steininger, Andreas},
    title = {Supply Voltage Dependent On-Chip Single-Event Transient Pulse Shape Measurements in 90-nm Bulk CMOS Under Alpha Irradiation},
    journal = {IEEE Transactions on Nuclear Science},
    year = {2013},
    volume = {60},
    number = {4},
    pages = {2640--2646},
    keywords = {Alpha-particle radiation, analog on-chip measurement, microbeam experiments, 90-nm CMOS, particle beams, radiation effects in devices, radiation effects in ICs, sense amplifier, single-event effects, single-event transients, supply voltage dependence}
}


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