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@inproceedings{TUW-257737,
    author = {Polzer, Thomas and Steininger, Andreas},
    title = {A General Approach for Comparing Metastable Behavior of Digital CMOS Gates},
    booktitle = {Proc 19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems},
    year = {2016},
    numpages = {6},
    isbn = {978-1-5090-2467-4},
    keywords = {Metastability, reliability model, mean time between failure},
    note = {talk: 19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Kosice, Slovakia; 2016-04-20 -- 2016-04-22}
}


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