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@inproceedings{TUW-274800,
    author = {Rathore, Vijeta and Chaturvedi, Vivek and Singh, Amit K. and Srikanthan, Thambipillai and R., Rohith and Lam, Siew-Kei and Shafique, Muhammad},
    title = {HiMap: A Hierarchical Mapping Approach for Enhancing Lifetime Reliability of Dark Silicon Manycore Systems},
    booktitle = {IEEE/ACM 21st Design, Automation and Test in Europe Conference {\&} Exhibition (DATE)},
    year = {2018},
    pages = {991--996},
    isbn = {978-3-9819263-1-6},
    doi = {10.23919/DATE.2018.8342153},
    keywords = {lifetime, reliability, aging, mapping, manycore systems, dark silicon, process variation, optimization},
    note = {talk: 2018 Design, Automation {\&} Test in Europe Conference {\&} Exhibition (DATE'18), Dresden, Deutschland; 2018-03-19 -- 2018-03-23}
}


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