Publikationsliste für Angehörige von
E362 - Institut für Festkörperelektronik
als Autorinnen / Autoren bzw. wesentlich beteiligte Personen
Berichte
1996 - 2024
44 Datensätze
Wissenschaftliche Berichte
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H. D. Wanzenböck:
"3-dimensionale NIL Master und Abformung von 3D-Fresenl-Linsen";
2014;
10 S.
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S. Lindsey, G. Hobler, C. Rue, M. Maazouz:
"Focused Ion Beam Simulation - Investigation of the Curtaining Effect in TEM Sample Preparation";
2012.
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H. D. Wanzenböck:
"Progress report of Vienna University of Technology 3rd year (Oct. 2011 - Sept. 2012)";
2012;
10 S.
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H. D. Wanzenböck:
""ENHANCE" - Midterm Review of the Marie-Curie International Training Network";
2011.
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H. D. Wanzenböck:
"NILaustria_I - Final Projekt report of the NILaustria programme of the Austrian Nanoinitiative";
2011.
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H. D. Wanzenböck:
"NILaustria_I - M36-Report (Project report of Month 36 of the NILaustria programme of the Austrian Nanointiative";
2011.
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H. D. Wanzenböck:
"WireCat";
Bericht für FWF;
2011.
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T. Zahel, G. Hobler:
"IMSIL-kLMC";
2009.
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T. Zahel, G. Hobler:
"Kinetic Monte Carlo studies of Smart Cut technology in Si: Final report";
2009.
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P. Beck, G. Hobler, A. Köck, S. Rollet, E. Wachmann, M. Wind:
"RADSI - Radiation Hardness of Silicon Nanostructures, Technical final report";
2008.
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J. Kuzmik:
"Final activity report";
2008.
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J. Kuzmik:
"Ultragan 3nd annual activity report";
2008.
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H. D. Wanzenböck:
"NextGen-FEBIP - Jahresbericht";
Bericht für Carl Zeiss NTS;
2008.
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H. D. Wanzenböck:
"NextGen-FEBIP - Zwischenbericht";
Bericht für Carl Zeiss NTS;
2008.
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T. Zahel, G. Hobler:
"Kinetic Monte Carlo studies of Smart Cut technology in Si: Platelet model and influence of He damage on platelet formation";
2008.
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T. Zahel, G. Hobler:
"Kinetic Monte Carlo studies of Smart Cut technology in Si: The influence of He damage on defects generated by H and He co-implantation";
2008.
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A.M. Andrews, A. Benz, G. Fasching, C. Deutsch, M. Austerer, W. Schrenk, K. Unterrainer, G. Strasser:
"Non-linear optics and photonics in quantum cascade lasers";
Bericht für Physics of InterSubband Emitters (POISE);
2007;
11 S.
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A.M. Andrews, A. Benz, G. Fasching, C. Deutsch, M. Austerer, W. Schrenk, K. Unterrainer, G. Strasser:
"Physics of InterSubband Emitters (POISE) 36-Month Report: Vienna University of Technology Contribution";
Bericht für Physics of InterSubband Emitters (POISE);
2007;
11 S.
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P. Beck, G. Hobler, E. Wachmann:
"RADSI Progress Report";
2007.
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G. Hobler:
"IMSIL Code Modification and Calibration for H inplantations into GaN";
2007.
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G. Hobler, D. Kovac:
"Interim Report on FIBSIM Code Development";
2007.
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G. Hobler, T. Zahel:
"Kinetic Monte Carlo studies of Smart Cut technology in Si";
2007.
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J. Kuzmik, D. Pogany:
"Ultragan 2nd annual activity report";
2007.
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J. Kuzmik, D. Pogany:
"ULTRAGAN contractual Deliverable D3.1: Insulated gate InAlN/GaN HEMT";
2007.
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J. Kuzmik, D. Pogany:
"ULTRAGAN contractual Deliverable D3.2: Passivated InAlN/GaN HEMT";
2007.
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J. Kuzmik, D. Pogany:
"Ultragan contractual Deliverable D4.2: Thermal condcutivity measurement results on InAlN materials";
2007.
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J. Kuzmik, D. Pogany:
"Ultragan contracutal Deliverable D5.2: Report on preliminary evaluation on the breakdown mechanisms";
2007.
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D. Pogany:
"Final SIDRA Medea + projekt report to FFG";
2007.
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D. Pogany:
"Report on ESD measurements by TIM to AMIS";
2007.
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D. Pogany:
"Report on ESD measurements by TIM to Atmel";
2007.
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D. Pogany:
"Report on ESD measurements by TIM to LAAS";
2007.
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D. Pogany:
"Report on ESD measurements by TIM to NXP (SIDRA)";
2007.
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D. Pogany:
"Report on ESD measurements by TIM to Texas Instruments";
2007.
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D. Pogany:
"Report on latch-up TIM measurements for ZETEX";
2007.
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D. Pogany:
"Report on TIM thermal measurements to IMS/NXP";
2007.
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D. Pogany:
"Reports on TIM measurements of ESD protection devices to Infineon";
2007.
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F.F. Schrey, G. Fasching, A. Müller, G. Strasser, K. Unterrainer:
"Ultrafast spectroscopy of QD structures for mid-infrared applications";
Bericht für The Society for Microelectronics - Annual Report 2006;
2006;
4 S.
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S. Abermann, W. Brezna, J. Smoliner, E. Bertagnolli, E. Gornik:
"SINANO-12 month progress report";
2005;
5 S.
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E. Bertagnolli, H. D. Wanzenböck, M. Fischer, G. Hochleitner:
"Projektbericht FEB-CVD";
2005;
42 S.
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W. Boxleitner, G. Hobler:
"High Quality Sample Operation for Nanometric Analysis and Testing Equipments";
2000.
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E. Gornik, D. Pogany, C. Fürböck:
"Report on failure analysis of semiconductor devices";
2000.
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E. Gornik, D. Pogany, C. Fürböck, M. Litzenberger:
"Endbericht für Ministery Projekt";
2000.
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E. Gornik, D. Pogany, C. Fürböck, M. Litzenberger:
"New characterisation methods for development of ESD protection structures";
2000.
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P.O. Kellermann, E. Gornik:
"Oberflaechenemittierende monomodige Laserdioden bei 650nm mit postepitaktischer Wellenlaengenadjustierung";
2000.