@inproceedings{TUW-233517, author = {Biffl, Stefan and L{\"u}der, Arndt and Schmidt, Nicole and Winkler, Dietmar}, title = {Early and Efficient Quality Assurance of Risky Technical Parameters in a Mechatronic Design Process}, booktitle = {Proceedings of the 40th Annual Conference of the IEEE Industrial Electronics Society (IECON 2014)}, year = {2014}, publisher = {IEEE}, keywords = {Risk Management for Manufacturing Systems Engineering, Mechatronic Engineering Process, Quality Assurance}, note = {Vortrag: 40th Annual Conference of the IEEE Industrial Electronics Society (IECON 2014), Dallas, Texas; 2014-10-28 -- 2014-11-01} }