N. Khalil, J. Faricelli, D. Bell, S. Selberherr:
"The Extraction of Two-Dimensional MOS Transistor Doping via Inverse Modeling";
IEEE Electron Device Letters, 16 (1995), 1; 17 - 19.
http://dx.doi.org/10.1109/55.363213Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_1995/JB1995_Khalil_2.pdf