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Zeitschriftenartikel:

M. Gritsch, C. Brunner, K. Piplits, H. Hutter, P. Wilhartitz, A. Schintlmeister, H. Martinz:
"Application of scanning SIMS techniques for the evaluation of the oxidation behaviour of high-purity molybdenum";
Fresenius Journal of Analytical Chemistry, 365 (1999), 1-3; S. 188 - 194.



Kurzfassung englisch:
Refractory metals are primarily characterized by a high melting point combined with a rather poor corrosion resistance under oxidizing atmosphere and therefore are mainly used in high temperature processes under reducing atmosphere or in vacuum. Exposure to an atmosphere of high humidity can lead to oxidation of the material even at room temperature. Different methods of surface pre-treatment have been applied to investigate their influence on the oxidation behavior of high-purity molybdenum. Within the scope of this work molybdenum foils and molybdenum discs consisting of the same base material were investigated. Since lateral surface structure as well as the in-depth distribution of contaminants are expected to play an important role in the oxidation process, both the in-depth distribution of the constituents within the oxide layer and the lateral distribution at the surface level of the oxide have been analyzed. Scanning SIMS has been engaged to analyze the uppermost structures of the oxide layer. In order to achieve maximum detection power and to gain the in-depth information, stigmatic SIMS has been applied to investigate the in-depth distribution of the interesting specimen constituents.


"Offizielle" elektronische Version der Publikation (entsprechend ihrem Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/s002160051470